Abstract
A new spectrum analyzer for an RF LSI Tester is developed. Using a high speed hopping synthesizer in the downconversion unit, this analyzer sweeps digitally at high speed. New applications for RF Testing are proposed using this fast digital sweep technology.
Cite
CITATION STYLE
Kumagai, M., Agawa, H., Nakagomi, M., Siratori, Y., Tanimura, D., Kumada, A., & Naganuma, H. (1994). A spectrum analyzer using a high speed hopping PLL synthesizer. In Conference Proceedings - 10th Anniv., IMTC 1994: Advanced Technologies in I and M. 1994 IEEE Instrumentation and Measurement Technology Conference (pp. 523–525). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/IMTC.1994.351903
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