Surface passivation of mercury-cadmium-Telluride infrared detectors

Abstract

The theoretical considerations and practical aspects of passivating insulator films, in the context of their use on high-performance mercury cadmium telluride (MCT) infrared detectors are reviewed. The methods of growth, the interface properties and the applications of both native and deposited passivant films have been discussed. Native films include anodic, chemical, photochemical, and plasma oxides as well as anodic sulphides and fluoro-oxides. Deposited films include ZnS, photo-CVD-grown SiO2, CdTe, and SiNx. The properties of all these passivant films on MCT have been summarized.