Abstract
Phase-change memory (PCM), recently developed as the storage-class memory in a computer system, is a new non-volatile memory technology. In addition, the applications of PCM in a non-von Neumann computing, such as neuromorphic computing and in-memory computing, are being investigated. Although PCM-based devices have been extensively studied, several concerns regarding the electrical, thermal, and structural dynamics of phase-change devices remain. In this article, aiming at PCM devices, a comprehensive review of PCM materials is provided, including the primary PCM device mechanics that underpin read and write operations, physics-based modeling initiatives and experimental characterization of the many features examined in nanoscale PCM devices. Finally, this review will propose a prognosis on a few unsolved challenges and highlight research areas of further investigation.
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CITATION STYLE
Jiang, K., Li, S., Chen, F., Zhu, L., & Li, W. (2023). Microstructure characterization, phase transition, and device application of phase-change memory materials. Science and Technology of Advanced Materials. Taylor and Francis Ltd. https://doi.org/10.1080/14686996.2023.2252725
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