Dopants and roughness induced resonances in thin Si nanowire transistors: A self-consistent NEGF-poisson study

5Citations
Citations of this article
14Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

Non-Equilibrium Green Function simulations of the effect of discrete ionised dopants and surface roughness in Silicon nanowire transistors show the strong presence of resonances in the transmission coefficients. These resonances or quasi-bound states are the main component in the screening of dopants and play an important role in the current flow. Resonances appear through a self-consistent calculation of the electron density and potential. In this work we study several examples that exhibit different types of resonances. We start with a single impurity case and gradually evolved to a complex case with several random impurities. Interface roughness in a very narrow nanowire could induce resonant cavities as is proven in this paper. The effect of these resonances in the current-voltage characteristic of the transistors is considered in detail. © 2010 IOP Publishing Ltd.

Cite

CITATION STYLE

APA

Martinez, A., Barker, R., Seoane, N., Brown, R., & Asenov, A. (2010). Dopants and roughness induced resonances in thin Si nanowire transistors: A self-consistent NEGF-poisson study. In Journal of Physics: Conference Series (Vol. 220). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/220/1/012009

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free