Advances in Sensors and Measurements for Metrological Applications

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Abstract

The preface discusses the summary of the special issue consisting of 24 peer-reviewed papers on the theme Advances in Sensors and Measurements for Metrological Applications. These papers discuss the state-of-the-art reviews by highlighting various technological innovations, processes developed pertaining to the design, development as well as characterization of sensors, their measurement methods/strategies at different National Metrology Institutes (NMIs) and academic/research institutes across the globe. Different methodologies adopted for designing the sensors and development of measurement methods have been presented by various researchers. These shall be instrumental in strengthening the traceability chain, fostering the industrial development and Industry 4.0 in national and international scenario.

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Chaudhary, K. P., Dubey, P. K., Gahlot, A., & Dahiya, A. (2021, June 1). Advances in Sensors and Measurements for Metrological Applications. Mapan - Journal of Metrology Society of India. Springer. https://doi.org/10.1007/s12647-021-00482-w

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