Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Cite
CITATION STYLE
APA
Lu, P., Van Benthem, M., & Jia, Q. (2013). Chemical Quantification of Atomic-scale EDS Maps under Thin Specimen Conditions. Microscopy and Microanalysis, 19(S2), 1298–1299. https://doi.org/10.1017/s1431927613008489
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