Support vector machine applications in terahertz pulsed signals feature sets

Abstract

In the past decade, terahertz radiation (T-rays) have been extensively applied within the fields of industrial and biomedical imaging, owing to their noninvasive property. Support vector machine (SVM) learning algorithms are sufficiently powerful to detect patterns hidden inside noisy biomedical measurements. This paper introduces a frequency orientation component method to extract T-ray feature sets for the application of two- and multiclass classification using SVMs. Effective discriminations of ribonucleic acid (RNA) samples and various powdered substances are demonstrated. The development of this method has become important in T-ray chemical sensing and image processing, which results in enhanced delectability useful for many applications, such as quality control, security detection and clinic diagnosis. © 2007 IEEE.