A novel AOI system for OLED panel inspection

Abstract

Organic light emitting diode (OLED) technology uses substances that emit red, green, blue or white light. An OLED panel consists of stacks of several thin layers of different materials, as such it is not easy to inspect the common OLED defects. In this paper, an autooptical inspection (AOI) system which can detect such defects effectively and robustly was proposed and developed. The proposed system can also identify, in which layer the defect occurred. Meanwhile, a moving mechanism coupled with a lighting mechanism was proposed and implemented for grabbing clear images. The proposed AOI system would provide great help in improving the OLED production process and the quality control process. © 2005 IOP Publishing Ltd.