Impact of the tip radius on the lateral resolution in piezoresponse force microscopy

Abstract

We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investigating bulk single crystals. The observed linear dependence of the apparent width of a ferroelectric domain wall on the tip radius as well as the independence of the lateral resolution on the specific crystal-type are validated by a simple model. Using a Ti-Pt coated tip with a nominal radius of 15 nm the so far highest lateral resolution in bulk crystals of only 17 nm was obtained. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft.