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Planar fault-tolerant logical measurements with low qubit overhead

  • Yang Y
  • Zhang G
  • Li Y
npj Quantum Information (2026)
DOI: 10.1038/s41534-026-01310-2
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Yang, Y., Zhang, G., & Li, Y. (2026). Planar fault-tolerant logical measurements with low qubit overhead. Npj Quantum Information. https://doi.org/10.1038/s41534-026-01310-2

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