Cobalt ferrite thin films deposited by electrophoresis on p-doped Si substrates

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Abstract

The structural and magnetic properties of cobalt ferrite (CoFe 2O4) thin films deposited by electrophoresis on p-doped Si(001) substrates have been characterized. The films were polycrystalline and composed by cobalt ferrite with the cubic spinnel structure. The observed decrease of the coercive field with the sixth power of the grain size was indicative of a competition between the magnetocrystalline anisotropy and the exchange coupling energy, on these randomly oriented nanosized grained films. © 2010 IOP Publishing Ltd.

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Barbosa, J. G., Pereira, M. R., Mendes, J. A., Proença, M. P., Araújo, J. P., & Almeida, B. G. (2010). Cobalt ferrite thin films deposited by electrophoresis on p-doped Si substrates. In Journal of Physics: Conference Series (Vol. 200). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/200/7/072009

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