Site-specific fragmentation of polystyrene molecule using size-selected Ar gas cluster ion beam

Abstract

The secondary ion mass spectrum (SIMS) of a polystyrene thin film was investigated using a size-selected Ar gas cluster ¡on beam (GCIB). The fragmentation In the SIM spectrum varied by kinetic energy per atom (E atom) ; the Eatom dependence of the secondary ion intensity of the fragment species of polystyrene can be essentially classified into three types based on the relationship between Eatom and the dissociation energy of a specific bonding site in the molecule. These results indicate that adjusting Eatom of size-selected GCIB may realize site-specific bond breaking within a molecule. © 2009 The Japan Society of Applied Physics.