Application of low-energy ion scattering to studies of growth

Abstract

The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. © 1994.