Conference Proceedings

Optical PCB inspection system based on Hausdorff distance

  • Chen C
  • Lai S
  • Liu S
  • et al.
Machine Vision Applications in Industrial Inspection XIII (2005) 5679 53
DOI: 10.1117/12.587553
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Chen, C.-J., Lai, S.-H., Liu, S.-W., Ku, T., & Yeh, S. Y. (2005). Optical PCB inspection system based on Hausdorff distance. In Machine Vision Applications in Industrial Inspection XIII (Vol. 5679, p. 53). SPIE. https://doi.org/10.1117/12.587553

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