High defect coverage with low-power test sequences in a BIST environment

Girard, P., Landrault, C., Pravossoudovitch, S., Virazel, A., & Wunderlich, H. J. (2002). High defect coverage with low-power test sequences in a BIST environment. IEEE Design and Test of Computers, 19(5), 44–52. https://doi.org/10.1109/MDT.2002.1033791