A Repetitive Acceptance Sampling Plan for Generalized Inverted Exponential Distribution Based on Truncated Life Test

Abstract

In this paper, we consider the generalized inverted exponential distribution (GIED) as a life model to develop various acceptance sampling schemes for truncated life tests. We develop the repetitive acceptance sampling plan (RASP) by attributes based on truncated life test and determine the design parameters satisfying both the producer's risk (α) and consumer's risk (β) simultaneously for the specified quality levels in terms of true median life ratio to the specified life. We are also to minimize average sample number where the constraints are related to the lot acceptance probabilities at the acceptance and limiting quality levels. The performance of the proposed plan is compared with single acceptance sampling plan under the GIED. The proposed sampling plan reduces the average sample number as compare to the single acceptance sampling plan. Tables are obtained for various values of shape parameter and the results are discussed. Also, discussion about the effect of misspecification of shape parameter is explained. Keywords-Consumer's risk, repetitive acceptance sampling plan, median life, generalized inverted exponential distribution, producer's risk.