Journal ArticleOPEN ACCESS

A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument

  • Principe E
  • Gnauck P
  • Hoffrogge P
Microscopy and Microanalysis (2005) 11(S02)
DOI: 10.1017/s1431927605502460
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005 [PUBLICATION ABSTRACT]

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APA

Principe, E. L., Gnauck, P., & Hoffrogge, P. (2005). A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument. Microscopy and Microanalysis, 11(S02). https://doi.org/10.1017/s1431927605502460

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