Journal ArticleOPEN ACCESS

Inference of Ga Ion TOF-SIMS Fragments of Metal-chlorides and -oxides.

  • Li Z
  • HOSHI T
  • HIROKAWA K
Hyomen Kagaku (2000) 21(10) 651-665
DOI: 10.1380/jsssj.21.651
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Li, Z., HOSHI, T., & HIROKAWA, K. (2000). Inference of Ga Ion TOF-SIMS Fragments of Metal-chlorides and -oxides. Hyomen Kagaku, 21(10), 651–665. https://doi.org/10.1380/jsssj.21.651

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