Abstract
With the continuous scaling down of the transistor size, the so-called intra-cell defects are more and more frequent. In this paper we propose a defect grading tool able to evaluate the efficiency of the applied test set. The test set efficiency is quantified w.r.t. the intra-cell defect coverage and the intra-cell diagnosis resolution.
Author supplied keywords
Cite
CITATION STYLE
Bosio, A., Dilillo, L., Girard, P., Todri-Sanial, A., Virazel, A., Bernabovi, S., & Bernardi, P. (2014). An intra-cell defect grading tool. In Proceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2014 (pp. 298–301). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/DDECS.2014.6868814
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
