The effect of interface texture on exchange biasing in Ni 80Fe 20/Ir 20Mn 80 system

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Abstract

Exchange-biasing phenomenon can induce an evident unidirectional hysteresis loop shift by spin coupling effect in the ferromagnetic (FM)/antiferromagnetic (AFM) interface which can be applied in magnetoresistance random access memory (MRAM) and recording-head applications. However, magnetic properties are the most important to AFM texturing. In this work, top-configuration exchange-biasing NiFe/IrMn(x Å) systems have been investigated with three different conditions. From the high-resolution cross-sectional transmission electron microscopy (HR X-TEM) and X-ray diffraction results, we conclude that the IrMn (111) texture plays an important role in exchange-biasing field (H ex) and interfacial exchange energy (J k). H ex and J k tend to saturate when the IrMn thickness increases. Moreover, the coercivity (H c) dependence on IrMn thickness is explained based on the coupling or decoupling effect between the spins of the NiFe and IrMn layers near the NiFe/IrMn interface. In this work, the optimal values for H ex and J k are 115 Oe and 0.062 erg/cm 2, respectively.

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Chen, Y. T. (2009). The effect of interface texture on exchange biasing in Ni 80Fe 20/Ir 20Mn 80 system. Nanoscale Research Letters, 4(1), 90–93. https://doi.org/10.1007/s11671-008-9207-4

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