Abstract
Cryogenic atom probe tomography (cryo-APT) is a new microstructure characterization technique with the potential to address challenges across various research fields. In this review, we provide an overview of the development of cryo-APT and the associated instrumentation that transforms conventional APT into cryo-APT. We start by introducing the APT principle and the instrumentation involved in the cryo-APT workflow, emphasizing the key techniques that enable cryo-APT specimen preparation. Furthermore, we shed light on the research made possible by cryo-APT, presenting several recent outcomes to demonstrate its capabilities effectively. Finally, we discuss the limitations of cryo-APT and summarize the potential research areas that can further benefit from this cutting-edge microstructural characterization technique.
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Zhou, Z., Wang, Z., Niu, R., Liu, P. Y., Huang, C., Sun, Y. H., … Chen, Y. S. (2023). Cryogenic atom probe tomography and its applications: a review. Microstructures. OAE Publishing Inc. https://doi.org/10.20517/microstructures.2023.38
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