Near field millimeter wave microscopy with conical Teflon probes

Abstract

We demonstrate 260 GHz (λ=1.15 mm) near field imaging using a conical Teflon probe whose tip protrudes through an aperture in a tapered aluminum holder. The imaging system is based on a quasioptical millimeter wave vector network analyzer. We present a variety of different imaging examples of dielectrics and metals, in both reflection and transmission modes, as well as an analysis of interesting diffraction and scattering effects observed in some of the images. The probe has an approximate tip diameter of 0.17 mm and an aperture size of about 1 mm. We observe horizontal resolution ranging from 0.2-0.5 mm depending on the sample being imaged. © 2009 American Institute of Physics.