SEI Growth and Depth Profiling on ZFO Electrodes by Soft X-Ray Absorption Spectroscopy

Abstract

The evolution of the solid electrolyte interface (SEI) in carbon-coated ZnFe2O4 (ZFO-C) anodes is studied by soft X-ray absorption spectroscopy (XAS). Experiments probe locally the SEI growth in the 2-100 nm range, using both total electron (TEY) and total fluorescence (TFY) yield techniques. XAS analysis shows that the SEI grows preferentially around the ZFO-C nanoparticles.