A time delay multiple integration linear CMOS image sensor for multispectral satellite telemetry

2Citations
Citations of this article
11Readers
Mendeley users who have this article in their library.
Get full text

Abstract

This paper presents a time delay multiple integration (TDMI) linear CMOS image sensor for multispectral satellite telemetry. With the proposed hybrid structure of analog and digital accumulation, the implemented time delay multiple integrator integrates the functions of TDI, multiple sampling (MS), and analog-to-digital conversion in a single chip. An 8 × 128 linear CMOS image sensor prototype was fabricated in 0.18-μm 1P6M 1.8 V CMOS technology. With an operation of ×8 TDI, ×64 MS, and a line time of 414.72 μs, the measured sensitivity, SNR improvement, and power consumption are 40.42 V/lux-s, 9.37 dB, and 17.77 mW, respectively.

Cite

CITATION STYLE

APA

Liu, K. L., Hsieh, C. C., Lai, S. Y., & Chiu, C. F. (2017). A time delay multiple integration linear CMOS image sensor for multispectral satellite telemetry. In 2016 IEEE Asian Solid-State Circuits Conference, A-SSCC 2016 - Proceedings (pp. 37–40). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/ASSCC.2016.7844129

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free