Microwave penetration depth measurements on Bi2Sr2CaCu2O8 single crystals and YBa2Cu3O7-δ thin films

Abstract

The temperature dependence of the magnetic penetration depth of Bi2Sr2CaCu2O8 single crystals and YBa2Cu3O7-δ thin films has been measured with a parallel plate resonator technique at microwave frequencies. Both materials show a T2 temperature dependence between 10 and 25 K, and systematic deviations towards a flatter temperature dependence below 10 K. We have also calculated the real part of the complex conductivity of YBa2Cu3O7-δ thin films from our penetration depth and surface resistance data and compare them with those of YBa2Cu3O7-δ single crystals. © 1993 The American Physical Society.