Polarized infrared attenuated total reflection study of sapphire crystals with different crystallographic planes

Abstract

Polarized infrared (IR) attenuated total reflection (ATR) measurements were performed on c- (polar) and r-plane (semi-polar) sapphire crystals. For c-plane sapphire crystal, spectral features due to the surface phonon polariton (SPhP) modes are only observable in the p-polarized ATR spectrum. Calculation of the SPhP dispersion spectra revealed that the SPhP modes of r-plane sapphire crystal are possible to be observed in both the s- and p-polarized ATR spectra. ATR measurements verified that excitation of the SPhP modes are still easier in the p-polarized ATR spectra. Taking into account the effects of anisotropy and the crystal orientation of hexagonal crystal system, the ATR spectra of r-plane sapphire crystal with arbitrary orientations were simulated. Through a best fit of experimental with simulated spectra, information about the crystal orientation of sapphire crystals was deduced.