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STEM Fluctuation Microscopy Characterization of an Amorphous – Protocrystalline Metal Glass Nanocomposite

  • Yi F
  • Hwang J
  • Imhoff S
  • et al.
Microscopy and Microanalysis (2010) 16(S2) 1644-1645
DOI: 10.1017/s1431927610056618
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Yi, F., Hwang, J., Imhoff, S., Perepezko, J., & Voyles, P. (2010). STEM Fluctuation Microscopy Characterization of an Amorphous – Protocrystalline Metal Glass Nanocomposite. Microscopy and Microanalysis, 16(S2), 1644–1645. https://doi.org/10.1017/s1431927610056618

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