Abstract
In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.
Cite
CITATION STYLE
APA
Lu, C. W., Lee, C. L., & Chen, J. E. (1996). A fast and sensitive built-in current sensor for IDDQ testing. In Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996 (pp. 56–58). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/IDDQ.1996.557816
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
Already have an account? Sign in
Sign up for free