Abstract
STT-MRAM is currently under intense R&D efforts thanks to its high performances such as non-volatility, fast access speed and high density etc. However, it suffers from intrinsic stochastic switching behaviors and high sensitivity to process variations, which make low power reliable reading become a big challenge. This letter presents three designs of reference cell for STT-MRAM sensing. By using an accurate compact model of STT-MRAM cell, we analyze and compare their performances in terms of power, reliability and area. © IEICE 2013.
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CITATION STYLE
Zhang, L., Zhao, W., Zhuang, Y., Bao, J., Tang, H., Li, C., & Xiang, X. (2013). Design and analysis of the reference cells for STT-MRAM. IEICE Electronics Express, 10(12). https://doi.org/10.1587/elex.10.20130352
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