Progress in MicroLEDs: Materials, Device Performance, and Reliability

Abstract

We present state of the art for microLED materials, devices, and reliability. We show performance efficiencies as a function of current density and device size for InGaN Red, Green, and Blue and AlInGaP Red materials and breakdown EQE into constituent IQE and extraction efficiency. We also present reliability results for these structures across all materials systems. We then review several concurrently developed technologies that serve to maximize microLED performance in application use.