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Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution

  • Takahashi H
  • Handa N
  • Murano T
  • et al.
Microscopy and Microanalysis (2013) 19(S2) 1258-1259
DOI: 10.1017/s1431927613008283
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Takahashi, H., Handa, N., Murano, T., Terauchi, M., Koike, M., Imazono, T., … Kuramoto, S. (2013). Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution. Microscopy and Microanalysis, 19(S2), 1258–1259. https://doi.org/10.1017/s1431927613008283

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