Abstract
Beam damage to ceria abrasive particles during EELS measurements with ∼1 nm probes of ∼1nA was negligible for typical analysis times (1-5 s). Ce3+ and tri-valent impurities reduce near-surface regions. Ce valence was measured from Ce M5/M4 white line ratios. By defocusing a 1 nA probe to ∼5 nm, beam damage to nanoscale MgAl 2O4 spinel was sufficiently slowed to allow spectrum imaging measurements of composition variations. Recording spectrum lines in TEM mode can be attractive when dose-rate rather than dose is the limiting factor in beam damage. Multivariate statistical analysis of data from a CoO-Co 3O4 interface has revealed an additional interface-related component. © 2006 IOP Publishing Ltd.
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CITATION STYLE
Bentley, J., Gilliss, S. R., Carter, C. B., Al-Sharab, J. F., Cosandey, F., Anderson, I. M., & Kotula, P. J. (2006). Nanoscale EELS analysis of oxides: Composition mapping, valence determination and beam damage. In Journal of Physics: Conference Series (Vol. 26, pp. 69–72). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/26/1/016
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