High-throughput powder diffraction. I. A new approach to qualitative and quantitative powder diffraction pattern analysis using full pattern profiles

Abstract

A new integrated approach to full powder diffraction pattern analysis is described. This new approach incorporates wavelet-based data pre-processing, non-parametric statistical tests for full-pattern matching, and singular value decomposition to extract quantitative phase information from mixtures. Every measured data point is used in both qualitative and quantitative analyses. The success of this new integrated approach is demonstrated through examples using several test data sets. The methods are incorporated within the commercial software program SNAP-1D, and can be extended to high-throughput powder diffraction experiments. © 2004 International Union of Crystallography Printed in Great Britain - all rights reserved.