Effect of annealing on the microstructure and properties of in-situ Cu-Nb microcomposite wires

Abstract

The effects of annealing on microstructure, magnetoresistance, and hardness of an in situ Cu-Nb microcomposite wire have been investigated. Neither changes in microstructure nor hardness were found until 500 °C. Particularly, microstructural change within the Nb films was observed in the annealed samples. The room-temperature magnetoresistivity was almost negligible, while magnetoresistivity at -196 °C increased with magnetic field. At temperature above 500 °C, recovery and recrystallization occurred, and both the resistance and hardness decreased.