Journal ArticleOPEN ACCESS

High-Throughput, Semi-Automated Quantitative STEM Atom Counting in Supported Metal Nanoparticles Using a Conventional TEM/STEM

  • House S
  • Chen Y
  • Jin R
  • et al.
Microscopy and Microanalysis (2016) 22(S3) 938-939
DOI: 10.1017/s1431927616005535
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APA

House, S. D., Chen, Y., Jin, R., & Yang, J. C. (2016). High-Throughput, Semi-Automated Quantitative STEM Atom Counting in Supported Metal Nanoparticles Using a Conventional TEM/STEM. Microscopy and Microanalysis, 22(S3), 938–939. https://doi.org/10.1017/s1431927616005535

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