Research and application of calibration methods for CMOS temperature sensors

Abstract

The CMOS temperature sensor, with its advantages of low power consumption, high integration, and digital output, has been widely adopted in smart healthcare, IoT, and wearable devices. To address performance variations caused by process deviations during mass production, this study proposed an efficient multi-temperature-point calibration method. The calibration system employed standard platinum resistance thermometers, thermal chambers, and precision electrical measurement equipment. The stability was calculated using Bessel's formula, confirming the repeatability of the calibration methodology. Experimental results demonstrated that calibrated sensors achieved significantly reduced measurement errors within the -55 °C to 215 °C range, with stability performance better than 0.41 °C. The research proved that both standard voltage and current inputs could enable rapid calibration, providing an effective solution for reducing production costs and enhancing product consistency.