Abstract
We differentiate the effect of strain induced by lattice-mismatched growth from strain induced by mechanical deformation on cubic nonradiative Auger recombination in narrow-gap GaInAsSb/GaSb quantum well (QW) heterostructures. The typical reduction in the Auger coefficient observed with lattice-mismatched growth appears to be due to the concomitant compositional change rather than the addition of strain, with implications for mid-IR semiconductor laser design. We induced a range of internal compressive strain in five samples from -0.90% to -2.07% by varying the composition during the growth and mechanically induced a similar range of internal strain in analogous quantum well membrane samples. We performed time-resolved photoluminescence and differential reflectivity measurements to extract the carrier recombination dynamics, taken at 300 K with carrier densities from 2.7 × 10 18 cm-3 to 1.4 × 10 19 cm-3. We observed no change with strain in the cubic Auger coefficient of samples that were strained mechanically, but we did observe a trend with strain in samples that were strained by the QW alloy composition. Measured Auger coefficients ranged from 3.0 × 1 0 - 29 cm6 s-1 to 3.0 × 1 0 - 28 cm6 s-1.
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CITATION STYLE
Underwood, K. J., Briggs, A. F., Sifferman, S. D., Verma, V. B., Sirica, N. S., Prasankumar, R. P., … Gopinath, J. T. (2020). Strain dependence of Auger recombination in 3 μ m GaInAsSb/GaSb type-I active regions. Applied Physics Letters, 116(26). https://doi.org/10.1063/5.0007512
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