Temporal Stability of the Japanese Versions of the Flourishing Scale and the Scale of Positive and Negative Experience

Abstract

The Flourishing Scale (FS) and the Scale of Positive and Negative Experience (SPANE) are reliable, valid instruments used to assess aspects of well-being such as psychological flourishing and positive and negative feelings. The Japanese versions of these scales (FS-J and SPANE-J) have been shown to have adequate internal consistency and construct validity. Test-retest reliability of the Japanese versions, however, has not yet been assessed. Therefore, the purpose of this study was to assess the test-retest reliability of the Japanese versions. The temporal stability of the factor structure of the Japanese versions was also evaluated. The FS-J and SPANE-J data were collected from 336 Japanese college students in two sessions conducted one month apart. The participants completed the Japanese versions in both sessions. The results indicated acceptable test-retest reliability for the FS-J (0.87) and SPANE-J (0.57-0.60). Simultaneous confirmatory factor analysis supported the temporal stability of the hypothesized factor structures for the Japanese versions over the one-month interval.