Use of computer processing by the method of multi-threshold cross sections for the analysis of optical images of fractal surface microstructure

Abstract

Multi-threshold slices of an intensity of the optical images of the surface were used for a quantitative assessment of physical and chemical processes on the covering. Computer analysis was applied for testing the real relief by correlation of the image intensity with a geometrical profile representation (axis Z is accepted as optical microscopy intensity scale). The multithreshold method of image analysis proposed and applied in the present study is based on an assessment of the fractal dimension of relief elements rather than the entire surface "as a whole", which makes the processing procedure effective in the images of any origin (not only optical microscopy data, but also scanning electron microscopy). It is shown that the replacement of full-profile analysis with the analysis of the series arrays of the sections along the axis of the intensity makes the determination of the fractal dimension of complex surface topography formed under nonequilibrium conditions quite simple. The effect of the thickness and the stress-strain state of ion-plasma diboride's layers formed as the fractal dimension surface structure was considered. The use of colour optical image analysis techniques and assumption about the existence of the four components of the graphene layer on copper, opens the way to carry out morphological analysis of islands of each type and propose the model of stages of formation of the graphene coating.