Local residual stress in partially recrystallized iron characterized using high resolution electron backscatter diffraction

Abstract

Recent synchrotron measurements have shown the presence of local residual stress within nearly defect-free grains in partially recrystallized samples. A detailed quantification of such local stress is very important for understanding local boundary migration during recrystallization and for tailoring the microstructure of materials. In this study, we utilize high resolution electron backscatter diffraction (HR-EBSD, Wilkinson's method) to investigate the local residual stress in recrystallized grains in a sample of partially recrystallized iron. The effects of reference selection on the strain distribution are also discussed.