Reflection zone plates for 2D focusing and spectroscopy of hard X-rays

Abstract

We propose the use of reflection zone plates (RZP) for two main applications: focusing and spectroscopy. A RZP combines three optical properties-reflection, imaging and dispersion-in one optical element. Having been successfully implemented into an X-ray fs-beamline at BESSY II, RZPs could be an important device in upcoming new high brilliance X-ray sources such as Free Electron Lasers (FEL). The reduction of the number of optical elements in a beamline would allow the highest possible transmission and satisfy the purpose of conserving the unique properties of FELs such as their high coherence. © 2013 IOP Publishing Ltd.