Development of X-ray photoemission electron microscopy (X-PEEM) at the SRS

Abstract

The use of synchrotron radiation sources for X-ray spectroscopy is a well known and developed field. The majority of applications, however, have been limited to studies of materials containing only a single phase of the element of interest. Owing to limited availability of suitable instrumentation, the study of materials comprising intergrowths of different phases has presented difficulties in analysis. The majority of natural materials, including mineralogical samples, fall into this category. However, by applying the technique of photoemission electron microscopy (PEEM) to view the X-ray stimulated photoemission generated at an absorption edge, micro-area-selectable spectroscopy becomes possible. An instrument for X-ray PEEM (X-PEEM) is being developed at the Daresbury SRS and this paper shows how it can be used to obtain characteristic L-edge XANES spectra from finely intergrown iron oxide minerals.