X-ray photoelectron spectroscopy of pulsed laser deposited Pb(Zr,Ti)O 3-Ií

Abstract

High quality pulsed laser deposited lead zirconate titanate (PZT) films are obtained by pulsed laser deposition on SrRuO 3(111) single crystal layers and characterized by X-ray photoelectron spectroscopy (XPS), to determine the surface composition. It is found that a minor amount of Pb forms PbO 2 at the surface and also some Pb is included into the contamination layer, in form of a Pb(CO 3) 2 layer of about 1 nm thickness, occupying about one quarter of the PZT surface. The stoichiometry of the outermost 4-5 nm layers yielded as PbZr 0.25Ti 0.80O 2.5, which suggest the formation of an oxygen depleted, Brownmillerite-like layer at the surface, of at least 5 nm thickness. Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.