New tools for surface second-harmonic generation

Abstract

New tools used for analyzing the second harmonic generation data was presented. The frequency doubling method of light was widely used for probing surfaces and interfaces, thereby providing insights into oriented surface systems. Recent advancements in instrumentation, application, and analysis of second-harmonic measurements were reviewed. Microscopic and spectroscopic techniques were used to measure the second-harmonic generation effects. RMS roughness of optically flat surfaces and their corresponding influence on the measurements was also discussed. Methods for preparing oriented thin surface films for nonlinear optical applications were reported.