Failure prediction of ic interconnect structures using cohesive zone modelling

Van Hal, B. A. E., Peerlings, R. H. J., Geers, M. G. D., & Zhang, G. Q. (2006). Failure prediction of ic interconnect structures using cohesive zone modelling. In Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture (pp. 387–388). Kluwer Academic Publishers. https://doi.org/10.1007/1-4020-4972-2_191