A position-sensitive ionization chamber for XAFS studies at synchrotron sources

Abstract

A position-sensitive ionization chamber has been developed with backgammon-type-segmented electrodes. This novel detector possesses a linear range of 8 mm for determining the incident position of the X-ray beam incoming. The position resolution was found to be less than 10 um, probably close the sub-micrometer region. Owing to its high spatial resolution, the position-sensitive ionization chamber was able to commit that the gradual decrease observed in the X-ray beam intensity at a SPring-8 beamline was mainly due to the spatial variation of the X-ray beam in time. The present work also confirmed the applicability of the novel detector to the accurate monochromator adjustment for experiments using diamond anvil cells.