Abstract
CrAIN films were prepared using a pulsed DC balanced reactive sputtering system under different N2/Ar ratios and pulse widths. We investigated the oxidation resistance of two CrAIN films with different microstructures; i) with a fcc-CrN structure, lower internal stress and moderate hardness, and ii) with a mixed structure of hep-AIN and hcp-Cr2N phases, higher internal stress and super high hardness of 41 GPa. The CrAIN film (i) having the single fcc-CrN structure showed good oxidation resistance up to 900°C. The plastic hardness of this film increased to a maximum of 38.5 GPa at 900°C. In contrast, the CrAIN film (ii) with the mixed structure of hcp-AIN and hcp-Cr2N phases was stable up to 800°C. The plastic hardness of this film decreased gradually with annealing. © 2010 The Japan Institute of Metals.
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Khamseh, S., Nose, M., Kawabata, T., Matsuda, K., & Ikeno, S. (2010). Oxidation resistance of CrAIN films with different microstructures prepared by pulsed DC balanced magnetron sputtering system. Materials Transactions, 51(2), 271–276. https://doi.org/10.2320/matertrans.MC200912
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