Multiscale Exploration of Texture and Microstructure Development in Recrystallization Annealing of Heavily Deformed Ferritic Alloys

Abstract

We present a multi-scale study of recrystallization annealing of an 85% cold rolled Fe-3%Si-0.1%Sn alloy using a combination of dark field X-ray microscopy (DFXM), synchrotron X-ray diffraction (SXRD), and electron backscatter diffraction (EBSD). Grains of interest from high stored energy (HSE) regions in a 200μm-thick sample are studied using DFXM during isothermal annealing. The intra-granular structure of the as deformed grain reveals deformation bands separated by ≈ 3–5° misorientation. Geometrically Necessary Dislocation evolution during recrystallization and growth is investigated. These findings are supported by a quantitative non-destructive texture analysis using SXRD in terms of pole figures and orientation distribution functions. Although no significant macroscopic texture change is observed up to 50% recrystallization, the calculated texture index indicates different nucleation and growth processes at various stages of annealing. Our results show that zones of local misorientation in the HSE regions are decisive for the formation and growth of recrystallized grains.