Abstract
Efficient, high-power, Al-free active-region diode lasers emitting at λ = 0.83 μm have been grown by low-pressure metallorganic chemical vapor deposition. Two laser structures were studied. The first used In0.5(Ga0.5Al0.5)0.5P cladding layers and provided 1-mm-long, uncoated devices with Jth = 220A/cm2, 4.6 W maximum cw output power and ηp,max = 45%. The second used on the p-side 0.1-μm-thick carrier-blocking layers of Al0.85Ga0.15As and In0.5(Ga0.5Al0.5)0.5P followed by an In0.5(Ga0.9Al0.1)0.5P cladding layer, and thus provided 4.7 W cw power and a COMD power density twice that of AlGaAs-active-layer devices. Therefore, these newly developed Al-free devices have the potential to be significantly more reliable than AlGaAs-based 0.81 μm devices.
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CITATION STYLE
Wade, J. K., Mawst, L. J., Botez, D., Jansen, M., Fang, F., & Nabiev, R. F. (1997). High continuous wave power, 0.8 μm-band, Al-free active-region diode lasers. Applied Physics Letters, 70(2), 149–151. https://doi.org/10.1063/1.118343
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