Abstract
A full-speed field-programmable memory BIST controller is proposed. The proposed instruction and architecture designs enable full-speed operation of not only March algorithms but also some non-linear algorithms that are becoming more and more important in modern memory testing, diagnosis, and failure analysis. © 2005 IEEE.
Cite
CITATION STYLE
APA
Xiaogang, D., Mukherjee, N., Cheng, W. T., & Reddy, S. M. (2005). Full-speed field-programmable memory BIST architecture. In Proceedings - International Test Conference (Vol. 2005, pp. 1165–1173). https://doi.org/10.1109/TEST.2005.1584084
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